Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology

نویسندگان

چکیده

A new transistor architecture is developed by reusing already existing fabrication process bricks in an embedded non-volatile memory (eNVM) sub-40 nm CMOS technology, resulting a middle-voltage zero-cost transistor, ideal for low-cost products. TCAD simulations are undertaken to confirm the feasibility of optimization and predict performance reliability. The fabricated then electrically characterized. device shows good analogue performances no cost added. hot-carrier injection (HCI) degradation evaluation performed confirms reliability device.

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ژورنال

عنوان ژورنال: Microelectronics Reliability

سال: 2021

ISSN: ['0026-2714', '1872-941X']

DOI: https://doi.org/10.1016/j.microrel.2021.114265